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Characterization and Modeling of Charging Effects in Dielectrics for the Actuation of RF MEMS Ohmic Series and Capacitive Shunt Switches

机译：驱动MEMS欧姆系列和电容并联开关的介电中充电效应的表征和建模

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Marcelli, R; Lucibello, A; De Angelis, G; Proietti, E; Papaioannou, G; Bartolucci, G; Giacomozzi, F; Margesin, B;
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年度 2012
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正文语种 eng
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2. A transient SPICE model for dielectric-charging effects in RF MEMS capacitive switches [J] . Xiaobin Yuan, Zhen Peng, Hwang J.C.M., IEEE Transactions on Electron Devices . 2006,第期

机译：瞬态SPICE模型，用于RF MEMS电容开关中的介电充电效应
3. Dielectric Charging in Electrostatically Actuated MEMS Ohmic Switches [J] . Peng Z., Palego C., Halder S., IEEE transactions on device and materials reliability . 2008,第4期

机译：静电驱动MEMS欧姆开关中的介电充电
4. Modeling and characterization of dielectric-charging effects in RF MEMS capacitive switches [C] . Xiaobin Yuan, Hwang, J.C.M., . 2005

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Characterization and Modeling of Charging Effects in Dielectrics for the Actuation of RF MEMS Ohmic Series and Capacitive Shunt Switches

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